Permanent and transient fault tolerance for reconfigurable nano-crossbar arrays
Permanent and transient fault tolerance for reconfigurable nano-crossbar arrays
dc.contributor.author | Tunali, Onur | |
dc.contributor.author | Altun, Mustafa | |
dc.contributor.authorID | https://orcid.org/0000-0002-3103-1809 | en_US |
dc.contributor.department | Department of Nanoscience and Nanoengineering | en_US |
dc.contributor.department | Department of Electronics and Communication Engineering | en_US |
dc.date.accessioned | 2019-05-23T10:50:05Z | |
dc.date.available | 2019-05-23T10:50:05Z | |
dc.date.issued | 2016-08-25 | |
dc.description.abstract | This paper studies fault tolerance in switching reconfigurable nano-crossbar arrays. Both permanent and transient faults are taken into account by independently assigning stuck-open and stuck-closed fault probabilities into crosspoints. In the presence of permanent faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. The algorithm's effectiveness is demonstrated on standard benchmark circuits in terms of runtime, success rate, and accuracy. In the presence of transient faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions. In this way, we are able to specify fault tolerance performances of nano-crossbars without relying on randomly generated faults that is relatively costly regarding that the number of fault distributions in a crossbar grows exponentially with the crossbar size. | en_US |
dc.description.sponsorship | Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer project is supported by the EU-H2020-RISE project NANOxCOMP 691178 and the TUBITAK-CAREER project 113E760. | en_US |
dc.description.version | Accepted for publication | |
dc.format.extent | 747 - 760 (14) | |
dc.identifier | Volume 36 | en_US |
dc.identifier | Issue 5 | en_US |
dc.identifier.citation | O. Tunali and M. Altun, "Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 36, no. 5, pp. 747-760, May 2017. doi: 10.1109/TCAD.2016.2602804 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7552492&isnumber=7904786 | en_US |
dc.identifier.issn | 1937-4151 (electronic) | |
dc.identifier.uri | http://hdl.handle.net/11527/18019 | |
dc.language | English | en_US |
dc.language.iso | en | en_US |
dc.publisher | en_US | |
dc.publisher | © Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.ispartof | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | en_US |
dc.relation.uri | https://ieeexplore.ieee.org/document/7552492/ | en_US |
dc.subject | Circuit faults | en_US |
dc.subject | Transient analysis | en_US |
dc.subject | Fault tolerance | en_US |
dc.subject | Fault tolerant systems | en_US |
dc.subject | Indexes | en_US |
dc.subject | Algorithm design and analysis | en_US |
dc.subject | Switches | en_US |
dc.title | Permanent and transient fault tolerance for reconfigurable nano-crossbar arrays | en_US |
dc.type | Article | en_US |
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