Yayın:
A Quantitative and Qualitative Comparison of 3D Digitization Techniques for Sustainable Display of High-Detail Museum Artifacts: The Sine Quadrant Example

Yükleniyor...
Küçük Resim

Kurum Yazarları

Item type:Araştırmacı/Yazar,
Şeker, Dursun Zafer
Profesor

Danışman

Bölüm / Program

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

MDPI AG

Türü

Araştırma Projeleri

Akademik Birimler

Dergi Sayısı

Özet

3D digitization of museum artifacts is essential for both their virtual presentation and re-exhibition in the event of damage or loss. Given the number of artifacts that can be exhibited in a museum, the effectiveness of single-digitization practices under designed conditions is limited in terms of realism. In this study, a highly detailed sine quadrant object was digitized in a museum environment using photogrammetry and structured-light scanning (SLS) techniques. 3D models were generated from point clouds derived in photogrammetry and directly obtained from SLS. In the qualitative assessment based on the distinguishability of linear and edge details, the photogrammetric technique was found to be better; in the quantitative assessment based on the reference length values on the artifact, SLS was better, while photogrammetry was also found to be adequate. The maximum difference values for photogrammetry and SLS were 0.40 and 0.27 cm, respectively, while the average difference values were 0.24 cm and 0.10 cm. Additionally, cloud-to-cloud distance analysis revealed that two-point clouds overlapped quite well geometrically. Point clouds were also compared in terms of homogeneity using outlier detection analysis. This analysis showed that noise in the photogrammetric point cloud had a wider distribution over the artifact. In terms of data acquisition and processing time, SLS was found to be better, while the cost was comparable. After evaluating the techniques from various perspectives, photogrammetry was found to be preferable for modeling in a museum environment due to the priority need for high texture quality from the end-user’s perspective. In this respect, SLS is highly dependent on hardware capability for both data acquisition and processing.

Tanım

Dergi veya Seri

Electronics

ISSN

ISBN

Haklar

OPEN

Anahtar Kelimeler

Alıntı

Koleksiyonlar

Onay

Gözden geçir

Tamamlayıcı Bilgiler

Referans Gösteren

Related Patent

Related Goal

1
Görüntülenme
0
İndirme
Altmetric
Dimensions
PlumX Metrikleri
BIP! Indicators
Google Scholar
Scholar'da Ara ↗