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Optical properties of Ta2O5 thin films deposited using the spin coating process

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dc.contributor.authorGhodsi, Farhad E.
dc.contributor.authorTepehan, Fatma Z.
dc.contributor.authorTepehan, Galip G.
dc.date.accessioned2026-01-24T14:49:02Z
dc.date.issued1997-02-01
dc.description.abstractAbstract Optical properties of tantalum pentoxide thin films have been investigated. The films were prepared by the sol-gel method using the spin coating process. Refractive index and absorption coefficient of the films have been calculated with respect to spinning velocity and number of coating layers from optical transmission measurement in the range 200-1100 nm. Forbidden bandgaps of the films are found to be 3.75 ± 0.12 eV and independent of the film thickness and spin rate.
dc.description.urihttps://doi.org/10.1016/s0040-6090(96)09509-0
dc.description.urihttps://dx.doi.org/10.1016/s0040-6090(96)09509-0
dc.identifier.doi10.1016/s0040-6090(96)09509-0
dc.identifier.endpage15
dc.identifier.issn0040-6090
dc.identifier.openairedoi_dedup___::087187132ac111f40f50d3a0601fdecb
dc.identifier.startpage11
dc.identifier.urihttps://hdl.handle.net/11527/33834
dc.identifier.volume295
dc.language.isoeng
dc.publisherElsevier BV
dc.relation.ispartofThin Solid Films
dc.rightsCLOSED
dc.titleOptical properties of Ta2O5 thin films deposited using the spin coating process
dc.typeArticle
dspace.entity.typePublication

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