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The Reliability Model for PMOS and NMOS Transistors Based on Statistical Methods

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dc.contributor.authorKuntman, Hakan
dc.contributor.authorÖzenli, Deniz
dc.contributor.authorKaçar, Fırat
dc.contributor.authorÖzçelep, Yasin
dc.date.accessioned2026-01-29T03:02:23Z
dc.date.issued2025-01-01
dc.description.urihttps://doi.org/10.1007/978-3-031-85455-2_2
dc.identifier.doi10.1007/978-3-031-85455-2_2
dc.identifier.openairedoi_________::7a874be95a8aab5cceb8c0a5617acacc
dc.identifier.urihttps://hdl.handle.net/11527/65802
dc.language.isoeng
dc.publisherSpringer Nature Switzerland
dc.rightsCLOSED
dc.titleThe Reliability Model for PMOS and NMOS Transistors Based on Statistical Methods
dc.typeBook Part
dspace.entity.typePublication

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