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Exchange bias in Pt doped NiMn thick films

dc.contributor.authorÖner, Y.
dc.contributor.authorÖzdemir, M.
dc.contributor.authorKazan, S.
dc.contributor.authorBasaran, A. C.
dc.contributor.authorAktas, B.
dc.contributor.authorSato, T.
dc.date.accessioned2026-01-26T05:03:51Z
dc.date.issued2010-04-21
dc.description.abstractMagnetization and electron spin resonance (ESR) measurements were carried out on a 1.2 at. % Pt doped NiMn thin film (8000 Å) in the temperature range of 5–200 K for both parallel (field parallel to the film surface) and perpendicular configurations. M versus H loops were recorded at selected temperatures. Magnetization curves in the parallel configuration differ from those in the perpendicular geometry in many respects, including the anisotropy fields derived from these curves, and the coercivity. In addition, the temperature dependences of the magnetization in a small negative field (−0.5 Oe) and several larger positive fields will also be reported. All of these phenomena can be understood by the coexistence of Mn-rich and Mn-deficient aggregated granular regions coupled antiferromagnetically. Furthermore, the exchange stiffness constant (D), bulk anisotropy constant, and surface anisotropy constant were deduced from ESR measurements. The fitted ESR parameters are in good agreement with the behavior deduced from magnetization.
dc.description.urihttps://doi.org/10.1063/1.3364049
dc.description.urihttps://dx.doi.org/10.1063/1.3364049
dc.identifier.doi10.1063/1.3364049
dc.identifier.eissn1089-7550
dc.identifier.issn0021-8979
dc.identifier.openairedoi_dedup___::e7a31514b31f2e02c56f2bfc02a9c1dc
dc.identifier.orcid0000-0002-8183-5733
dc.identifier.urihttps://hdl.handle.net/11527/61737
dc.identifier.volume107
dc.language.isoeng
dc.publisherAIP Publishing
dc.relation.ispartofJournal of Applied Physics
dc.sdg.typeGoal 7: Affordable and Clean Energy
dc.titleExchange bias in Pt doped NiMn thick films
dc.typeArticle
dspace.entity.typePublication

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