Publication:
Comparative Evaluation of Multiline TRL and 2X-Thru De-Embedding Implementation Methods on Printed Circuit Board Measurements

Loading...
Thumbnail Image

Institution Authors

Advisor

Department

Journal Title

Journal ISSN

Volume Title

Publisher

IEEE

Research Projects

Organizational Units

Journal Issue

Abstract

Description

Journal or Series

2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)

ISSN

ISBN

Rights

CLOSED

Keywords

Citation

Collections

Endorsement

Review

Supplemented By

Referenced By

Related Patent

Related Goal

0
Görüntülenme
0
İndirme
Altmetric
Dimensions
PlumX Metrikleri
BIP! Indicators
Google Scholar
Scholar'da Ara ↗