Detecting and Locating Dielectric Objects Buried Under a Rough Interface

Abstract

We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations