Publication: Surface Characterization of Irradiated Zno:Al Thin Film by Reactor Neutrons
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Trans Tech Publications, Ltd.
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Abstract
rradiation of ZnO:Al thin film by reactor neutrons with neutron/gamma ratio at 1.44x104 (n.cm-2.s-1.mR-1) leads to a decrease in resistivity in this material. The observed effects in electrical resistivity are attributed to irradiation-induced formation of defects in the ZnO:Al thin film structure.