Please use this identifier to cite or link to this item: http://hdl.handle.net/11527/18019
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dc.contributor.authorTunali, Onur
dc.contributor.authorAltun, Mustafa
dc.date.accessioned2019-05-23T10:50:05Z
dc.date.available2019-05-23T10:50:05Z
dc.date.issued2016-08-25
dc.identifierVolume 36en_US
dc.identifierIssue 5en_US
dc.identifier.citationO. Tunali and M. Altun, "Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 36, no. 5, pp. 747-760, May 2017. doi: 10.1109/TCAD.2016.2602804 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7552492&isnumber=7904786en_US
dc.identifier.issn1937-4151 (electronic)
dc.identifier.urihttp://hdl.handle.net/11527/18019
dc.description.abstractThis paper studies fault tolerance in switching reconfigurable nano-crossbar arrays. Both permanent and transient faults are taken into account by independently assigning stuck-open and stuck-closed fault probabilities into crosspoints. In the presence of permanent faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. The algorithm's effectiveness is demonstrated on standard benchmark circuits in terms of runtime, success rate, and accuracy. In the presence of transient faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions. In this way, we are able to specify fault tolerance performances of nano-crossbars without relying on randomly generated faults that is relatively costly regarding that the number of fault distributions in a crossbar grows exponentially with the crossbar size.en_US
dc.description.sponsorshipSynthesis and Performance Optimization of a Switching Nano-Crossbar Computer project is supported by the EU-H2020-RISE project NANOxCOMP 691178 and the TUBITAK-CAREER project 113E760.en_US
dc.format.extent747 - 760 (14)
dc.languageEnglishen_US
dc.language.isoenen_US
dc.publisheren_US
dc.publisher© Institute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsen_US
dc.relation.urihttps://ieeexplore.ieee.org/document/7552492/en_US
dc.subjectCircuit faultsen_US
dc.subjectTransient analysisen_US
dc.subjectFault toleranceen_US
dc.subjectFault tolerant systemsen_US
dc.subjectIndexesen_US
dc.subjectAlgorithm design and analysisen_US
dc.subjectSwitchesen_US
dc.titlePermanent and transient fault tolerance for reconfigurable nano-crossbar arraysen_US
dc.typeArticleen_US
dc.description.versionAccepted for publication
dc.contributor.authorIDhttps://orcid.org/0000-0002-3103-1809en_US
dc.contributor.departmentDepartment of Nanoscience and Nanoengineeringen_US
dc.contributor.departmentDepartment of Electronics and Communication Engineeringen_US
Appears in Collections:Elektronik ve Haberleşme Mühendisliği

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