Please use this identifier to cite or link to this item: http://hdl.handle.net/11527/18019
Title: Permanent and transient fault tolerance for reconfigurable nano-crossbar arrays
Authors: Tunali, Onur
Altun, Mustafa
https://orcid.org/0000-0002-3103-1809
Department of Nanoscience and Nanoengineering
Department of Electronics and Communication Engineering
Keywords: Circuit faults
Transient analysis
Fault tolerance
Fault tolerant systems
Indexes
Algorithm design and analysis
Switches
Issue Date: 25-Aug-2016
Publisher: 
© Institute of Electrical and Electronics Engineers (IEEE)
Citation: O. Tunali and M. Altun, "Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 36, no. 5, pp. 747-760, May 2017. doi: 10.1109/TCAD.2016.2602804 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7552492&isnumber=7904786
Abstract: This paper studies fault tolerance in switching reconfigurable nano-crossbar arrays. Both permanent and transient faults are taken into account by independently assigning stuck-open and stuck-closed fault probabilities into crosspoints. In the presence of permanent faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. The algorithm's effectiveness is demonstrated on standard benchmark circuits in terms of runtime, success rate, and accuracy. In the presence of transient faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions. In this way, we are able to specify fault tolerance performances of nano-crossbars without relying on randomly generated faults that is relatively costly regarding that the number of fault distributions in a crossbar grows exponentially with the crossbar size.
URI: http://hdl.handle.net/11527/18019
ISSN: 1937-4151 (electronic)
Other Identifiers: Volume 36
Issue 5
Appears in Collections:Elektronik ve Haberleşme Mühendisliği

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